Work

Coupling Path Analysis of Data Center Ssd Storage Systems Based on Visualization Technique

Year: 2025

Type: conference-paper

DOI: 10.1109/emcsipi52291.2025.11170206

Authors: Xiangrui Su, Haran Manoharan, Jihun Kim, Lalit Kumar, Heewon Kang, Chunghyun Ryu, Chulsoon Hwang

Institutions: Missouri University of Science and Technology, Samsung (South Korea), Samsung Electronics (South Korea)

Language: English

Topic: Electromagnetic Compatibility and Measurements

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Science Foundation, Samsung

Award: G7962077414

OpenAlex ID: W4414500409

FWCI:

Cites:

Cited by:

Related to: