Work

Lightweight Improvement of Multi-Scale Object Detection Model Based on Dual Attention Mechanism for Industrial Inspection

Year: 2025

Type: conference-paper

Source: International Conference on Electronics and Communication, Network and Computer Technology (ECNCT)

DOI: 10.1109/ecnct66493.2025.11172573

Author: Xian Wang

Institution: Xiamen Institute of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4414500416

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