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Planar Near-Field Measurements Based on Kernel Ridge Regression

Year: 2025

Type: conference-paper

DOI: 10.1109/emcsipi52291.2025.11170167

Authors: Xingbao Lin, Xumin Liu, Chen Liang, Xiongfei Long, Mengyao Hu, Zibin Weng

Institutions: Xidian University, Marine Design & Research Institute of China

Language: English

Topic: Electromagnetic Compatibility and Measurements

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4414500451

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Cites: 10

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