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CLAD: Semi-Supervised Contrastive Learning with Augmented Negatives for Label-Efficient Industrial Anomaly Detection

Year: 2025

Type: conference-paper

Source: International Conference on Communication Software and Networks

DOI: 10.1109/iccsn66511.2025.11172479

Authors: HongLiang Wang, YueNing Li, PengFei Xiu, Jing Xu, Hu Li

Institutions: Chinese Academy of Sciences, Shenyang Institute of Computing Technology (China)

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: National Science and Technology Major Project

OpenAlex ID: W4414500470

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