Work

Proposal of HEMP Conducted Disturbance Test Method for Semi-Conductor Protective Devices on Electronic Circuit

Year: 2025

Type: conference-paper

DOI: 10.1109/emcsipi52291.2025.11170218

Authors: Takuya Hoshino, Masaharu Sao, Tetsuya Tominaga, Minoru Tsukazaki

Institution: NTT Advanced Technology Corporation (Japan)

Language: English

Topic: Electromagnetic Compatibility and Noise Suppression

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4414500489

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Cites: 4

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