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Mitigating IEMI Induced Faults in PLL-Based Cryptographic Modules Through Narrow Loop Bandwidth

Year: 2025

Type: conference-paper

DOI: 10.1109/emcsipi52291.2025.11170301

Authors: Hikaru Nishiyama, Daisuke Fujimoto, Yuichi Hayashi

Institutions: National Institute of Advanced Industrial Science and Technology, Nara Institute of Science and Technology

Language: English

Topic: Cryptographic Implementations and Security

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4414500668

FWCI: 0.991

Cites: 12

Cited by: 1

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