Work

Measurement of Refractive Index and Thickness of Thin Films Via Polarization‐Projection Interferometry

Year: 2025

Type: article

Source: Laser & Photonics Review

DOI: 10.1002/lpor.202501395

Authors: Pengfei Zhu, Wei Wu, Di Zhang, Lun Qu, Lu Bai, Lin Li, Juntao Li, Mengxin Ren, Jingjun Xu

Institutions: Nankai University, Sun Yat-sen University, State Key Laboratory of Optoelectronic Materials and Technology, Shanxi University

Language: English

Topic: Optical Polarization and Ellipsometry

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, China Postdoctoral Science Foundation, Natural Science Foundation of Tianjin City, Higher Education Discipline Innovation Project, National Key Research and Development Program of China, Fundamental Research Funds for the Central Universities

Awards: G2938483977, G3345775339, G393662475, G4274587747, G521520261, G5535594252, G6243216975, G7349317890

OpenAlex ID: W4414521867

FWCI: 0.938

Cites: 45

Cited by: 4

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