Year: 2025
Type: preprint
Abstract: We demonstrate a major breakthrough in laser interferometry and microscopy achieving femtometer-level measurement accuracy and beyond, termed Phase Amplification microscopy (Φ-Amp). By exploiting the native silicide substrate as a phase cavity, our phase-gain theory predicts that weak sub-atomic phase signals can be magnified over 1000-fold, thus bypassing the shot-noise limit. We experimentally achieved a 158.2-fold phase gain for graphene in ambient air, corresponding ~ 730 femtometer accuracy. To fully unleash the potential of Φ-Amp for atomic fabrication and quantum measurement, we quantified interlayer spacing differences between AB-stacked and 30-degree-twisted bilayer graphene to be ~ 0.77 Angstroms and further detected atomic impurities and defects on large atomic structures. As the first wide-field metrology tool, we envision Φ-Amp may accelerate the scaling up of atomic quantum devices.
Source: arXiv (Cornell University)
Authors: Zhou, Nansen, Zhang, Qihang, Huang, Ting, Li, Helios Y., Xi, Chenjia, You, Jiawen, Zhang, Jinsong, Nie, Yujie, Huang, Chaoran, Gao, Zhaoli, Zhu, Jinlong, Zhan, Qiwen, Xu, Jianbin, Fang, Nicholas X., Zhou, Renjie
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W4414588581
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