Optimal Locally Repairable Codes With Multiple Erasure Tolerance
Year: 2025
Type: article
Source: IEEE Communications Letters
Authors: Jing Wang, Yan Ma, Tingting Yu, Kun Yang, Xiangyang Liu
Institutions: Chang'an University, Northwestern Polytechnical University
Language: English
Subfield: Artificial Intelligence
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
Awards: G7699683783, G8630362258
OpenAlex ID: W4414603469
