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A Low Memory-Consuming Diagnosis Method for Multiple Open-Circuit Faults of Dual Three-Phase PMSM Drives

Year: 2025

Type: article

Source: IEEE Transactions on Power Electronics

DOI: 10.1109/tpel.2025.3615618

Authors: Zhongchen Li, Qiang Geng, Feng Zhu, Zhanqing Zhou, Guozheng Zhang

Institution: Tiangong University

Language: English

Topic: Machine Fault Diagnosis Techniques

Subfield: Control and Systems Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funders: National Natural Science Foundation of China, Natural Science Foundation of Tianjin City

Awards: G3508953465, G7012481820, G7746111509

OpenAlex ID: W4414603472

FWCI:

Cites: 32

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