High Remnant Polarization (2P r > 65 μ C/cm 2 ) in Sputtered Hf x Zr 1- x O y Thin Films
Year: 2025
Type: article
Source: IEEE Electron Device Letters
Authors: Srinu Rowtu, Paritosh Meihar, Udayan Ganguly
Institution: Indian Institute of Technology Bombay
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4414603527