Work

Analysis of Short-Channel Hafnia-Based FeFET Device Variability Guided by Piezoresponse Force Microscopy

Year: 2025

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2025.3611907

Authors: Andreu L. Glasmann, Wendy L. Sarney, Christine K. McGinn, Christina A. Hacker, Sina Najmaei

Institutions: DEVCOM Army Research Laboratory, United States Army Combat Capabilities Development Command, University of Illinois Chicago, National Institute of Standards and Technology

Language: English

Topic: Ferroelectric and Negative Capacitance Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Research Council

OpenAlex ID: W4414604120

FWCI:

Cites: 28

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