Work

No Time for Surface Charge: How Bulk Conductivity Hides Charge Patterns from Kelvin Probe Force Microscopy in Contact-Electrified Surfaces

Year: 2025

Type: article

Abstract: Kelvin probe force microscopy (KPFM) is widely used in stationary and dynamic studies of contact electrification. An obvious question that connects these two has been overlooked: when are charge dynamics too fast for stationary studies to be meaningful? Using a rapid transfer system to quickly perform KPFM after contact, we find the dynamics are too fast in all but the best insulators. Our data further suggest that dynamics are caused by bulk as opposed to surface conductivity, and that charge-transfer heterogeneity is less prevalent than previously suggested.

Source: Physical Review Letters

DOI: 10.1103/lcsm-xxty

Authors: Felix Pertl, Isaac C. D. Lenton, Tobias Cramer, Scott Waitukaitis

Institutions: Institute of Science and Technology Austria, University of Bologna

Language: English

Topic: Advanced Sensor and Energy Harvesting Materials

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: hybrid

Estimated APC paid: $3,750

Funders: Institute of Science and Technology Austria, Horizon 2020 Framework Programme, European Research Council