Work

Development of the Model for Estimating Thickness and Optical Constants of Metallic Thin Films using Only Reflection Spectrum

Year: 2025

Type: article

Source: IEEJ Transactions on Sensors and Micromachines

DOI: 10.1541/ieejsmas.145.220

Authors: Yu Morinishi, Yusaku Maeda

Institution: National Institute of Technology, Kagawa College

Language: English

Topic: Optical Polarization and Ellipsometry

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4414640130

FWCI: 0.241

Cites: 10

Cited by: 1

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