Work

Fused Deposition Modeling Source Identification Using Smartphone Photographs and Deep Learning

Year: 2025

Type: conference-paper

DOI: 10.1115/msec2025-153006

Authors: Miles V. Bimrose, James H. Shin, Christopher H. Conway, Sameh Tawfick, William P. King

Institution: University of Illinois Urbana-Champaign

Language: English

Topic: Additive Manufacturing and 3D Printing Technologies

Subfield: Automotive Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4414644440

FWCI: 3.51

Cites:

Cited by: 2

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