Work

Features of Upsets Formation in Vlsi Under Pulsed Ionizing Radiation

Year: 2025

Type: article

Source: Russian Microelectronics

DOI: 10.7868/s3034548025030059

Author: A.I. Chumakov

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4414690389

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