Effect of Boundary Roughness on the Variability of the I-v Data of Silicon Field-effect Gaa Nanotransistors
Year: 2025
Type: article
Source: Russian Microelectronics
Author: N. V. Masalsky
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4414690410
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