Work

Regularities of X-ray Transfer in Doped Multicomponent Semiconductors for Dosimetry

Year: 2025

Type: article

Source: Russian Microelectronics

DOI: 10.7868/s3034548025020016

Author: M. M. Asadov

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4414690435

FWCI:

Cites:

Cited by:

Related to: