Work

Deep Learning-Based Classification of Nanoscale SEM Features Using Inception

Year: 2025

Type: conference-paper

DOI: 10.1109/icbmesh66209.2025.11182258

Authors: Shreyas Rajendra Hole, Jeevaraj R, Ujjwal Jaiswal, Vinothkumar Kolluru, Shreekant Salotagi, Justindhas Y

Institutions: Symbiosis International University, Global Academy of Technology, Dayananda Sagar University, Stevens Institute of Technology, Easwari Engineering College

Language: English

Topic: Advanced Neural Network Applications

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4414692968

FWCI: 8.565

Cites: 19

Cited by: 10

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