Silicon Sensor Characterization Testbench using the Transient Current Technique
Year: 2025
Type: conference-paper
Authors: Vinícius Fuchshuber Dos Santos, Antonio Vilela Pereira, Jorge Amaral, Tiago Quirino, Isabella Florêncio, Gabriel Bastos, Clemencia Mora, André Massafferri
Language: English
Subfield: Nuclear and High Energy Physics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4414693217
