On the Relation Between OC-LSSVM and Likelihood Test for Physical Layer Authentication
Year: 2025
Type: article
Source: IEEE Communications Letters
Authors: Francesco Ardizzon, Stefano Tomasin
Institution: University of Padua
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4414799003
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