Year: 2024
Type: article
Abstract: Scanning Probe Microscopy Scanning probe microscopy (SPM) has revolutionised our understanding of the nanoscale properties of solar cell materials, particularly halide perovskites. The article number 2407291 by Jincheol Kim, Jae Sung Yun, Jan Seidel, and co-workers, highlights how advanced SPM techniques can provide unprecedented insights into their electrical, optical, and chemical characteristics; significantly enhancing the design, synthesis, and processing of highly efficient next-generation solar cells.
Source: Advanced Materials
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: bronze
OpenAlex ID: W4414854123
