Work

Influencing Factors and Mechanisms of Single-Event Burnout in STP SiC MOSFETs

Year: 2025

Type: conference-paper

Source: IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia)

DOI: 10.1109/wipda-asia63772.2025.11184004

Authors: Ying Yang, Xulong Wang, Chen Wang, Zixuan Liu

Institution: Xi'an University of Technology

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Research and Development

OpenAlex ID: W4414898299

FWCI:

Cites: 10

Cited by:

Related to: