Work

Effect of Voltage Probes on the Characterisation of Switching Processes in Wide-bandgap Semiconductor Devices

Year: 2025

Type: conference-paper

Source: IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia)

DOI: 10.1109/wipda-asia63772.2025.11183706

Authors: Yishun Yan, Lurenhang Wang, Xuchong Cai, Mingcheng Ma, Yanchen Pan, Dianguo Xu

Institution: Harbin Institute of Technology

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4414898488

FWCI: 4.717

Cites: 9

Cited by: 2

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