Work

Research on Online Reliability Assessment Technology for IGBT Based on Driver-Side Measurement Fusion

Year: 2025

Type: conference-paper

Source: IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia)

DOI: 10.1109/wipda-asia63772.2025.11184067

Authors: Yi Liu, Zhicheng Liu, Yunhui Mei

Institution: Tiangong University

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDGs: Affordable and clean energy, Industry, innovation and infrastructure

Open Access status: closed

Funders: National Natural Science Foundation of China, Tianjin Municipal Science and Technology Bureau

OpenAlex ID: W4414898545

FWCI:

Cites: 19

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