Work

Cryogenic Output Capacitance Loss of GaN HD-GIT

Year: 2025

Type: conference-paper

Source: IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia)

DOI: 10.1109/wipda-asia63772.2025.11183851

Authors: Yudong Wang, Zilong Chen, Yukun Zhang, Chong Dou, Qian Cui, Yuqi Wei

Institutions: Xi'an Jiaotong University, Hefei Institute of Technology Innovation

Language: English

Topic: GaN-based semiconductor devices and materials

Subfield: Condensed Matter Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4414898572

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Cites: 14

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