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SiC VDMOSFET Performance Prediction Method Based on Neural Network

Year: 2025

Type: conference-paper

Source: IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia)

DOI: 10.1109/wipda-asia63772.2025.11184081

Authors: Xiamin Hao, Feng He, Rui Jin

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: State Grid Corporation of China

OpenAlex ID: W4414898580

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Cites: 13

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