Work

Lifetime Modeling of IGBT Devices Based on Micro-Defect Topography Inversion

Year: 2025

Type: conference-paper

Source: IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia)

DOI: 10.1109/wipda-asia63772.2025.11184059

Authors: Miaomiao Shangguan, Wei Lai, Hao Wang, Yunjie Wu, Yu Liu, Hang Zhao

Institution: Chongqing University

Language: English

Topic: Reliability and Maintenance Optimization

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

SDGs: Industry, innovation and infrastructure, Affordable and clean energy

Open Access status: closed

OpenAlex ID: W4414898634

FWCI:

Cites: 6

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