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UIS Ruggedness of Si/SiC Hybrid Switches
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Year:
2025
Type:
conference-paper
Source:
IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia)
DOI:
10.1109/wipda-asia63772.2025.11183872
Authors:
Chuanqi Zhang,
Xuanting Song,
Shiwei Liang,
Yuxing Dai,
Jun Wang,
Kamal Al-Haddad
show all 6
Institutions:
Hunan University,
Wenzhou University,
École de Technologie Supérieure
Language:
English
Topic:
Silicon Carbide Semiconductor Technologies
Subfield:
Electrical and Electronic Engineering
Field:
Engineering
Domain:
Physical Sciences
SDG:
Industry, innovation and infrastructure
Open Access status:
closed
OpenAlex ID:
W4414898651
FWCI:
Cites:
12
Cited by:
Related to: