Work

Impact of Electroluminescence Spectrum Sampling on SiC MOSFET Junction Temperature and Current Sensing

Year: 2025

Type: conference-paper

Source: IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia)

DOI: 10.1109/wipda-asia63772.2025.11184005

Authors: Yuting Jin, Hao Huang, Jingyang Hu, Shengjie Luo, Haoze Luo, Wuhua Li

Institution: Zhejiang University

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Key Research and Development Program of China

OpenAlex ID: W4414898737

FWCI:

Cites:

Cited by:

Related to: