Work

A Transistor Clamp Circuit of On-state Voltage Drop for SiC MOSFET Temperature Monitoring

Year: 2025

Type: conference-paper

Source: IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia)

DOI: 10.1109/wipda-asia63772.2025.11183935

Authors: Yixiang Zhao, Hong Li, Xiaofei Hu, Kuang Zhang

Institutions: Beijing Jiaotong University, Zhejiang University

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, National Science Fund for Distinguished Young Scholars

OpenAlex ID: W4414909284

FWCI: 2.3

Cites: 10

Cited by: 1

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