An Heuristic Approach to a Defect-Based Fatigue Life Estimation Via Optical Microscopy and Fatigue Crack Growth Rate Data
Year: 2025
Type: conference-paper
Authors: Jorge Gil, Beatriz Silva, Maria Vaz, Ana Reis, Abílio M. P. de Jesus
Institution: Universidade do Porto
Language: English
Subfield: Mechanics of Materials
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4414953709
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