Work

Image Segmentation of Integrated Circuit Chips Based on Otsu and Genetic Algorithms

Year: 2025

Type: conference-paper

DOI: 10.1109/icsip65915.2025.11171531

Authors: Qing Liu, Kai Qi, Xiaodong Wei, Wenjuan Zou, Yuxiang Zhao

Institution: Tianshui Normal University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4414957045

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