An Adaptive GA‐SVM Life Prediction Model for Solid‐State Light‐Emitting Devices Under the Failure Scenario of Accelerated Life Test: A Case Study of an OLED Product
Year: 2025
Type: article
Source: Luminescence
DOI: 10.1002/bio.70334
Authors: Haonan Zhang, Jianping Zhang, Pengju Zhang, Xiaodong Yu, Yi Wang, Weiguo Zhou, Bei Zhang
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4414982837