Work

Large‐Area Bi 2 Te 3 Flakes on Si‐Based Substrates for Sensitive IR Imaging Photodetection at MWIR Optical Communication Wavelengths

Year: 2025

Type: article

Source: Advanced Functional Materials

DOI: 10.1002/adfm.202523704

Authors: Yinze Zhang, Dongbo Wang, Wen He, Chenchen Zhao, Duoduo Ling, Qiudan Geng, Lei Chen, Wei Wu, Xuan Fang, Gang Liu, Liancheng Zhao, DongWei Jiang, Jinzhong Wang

Institutions: Harbin Institute of Technology, Henan University of Science and Technology, Changchun University of Science and Technology, Center for High Pressure Science and Technology Advanced Research, Chinese Academy of Sciences, Institute of Semiconductors

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Awards: G1058574004, G49671266

OpenAlex ID: W4414985578

FWCI: 3.38

Cites: 57

Cited by: 15

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