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Lens Glue Defect Detection Method Based on RevFPN

Year: 2025

Type: conference-paper

Source: International Conference on Artificial Intelligence, Big Data and Algorithms (CAIBDA)

DOI: 10.1109/caibda65784.2025.11183058

Authors: Kezhi Qin, Minlu Wang, Jiaxi He

Institutions: SAIC-GM-Wuling (China), Wuhan University of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4415003814

FWCI:

Cites: 7

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