Work

EBI-YOLO: A Hardware-Efficient Detector with Cross-Spatial Attention for Steel Surface Defects

Year: 2025

Type: conference-paper

Source: International Conference on Artificial Intelligence, Big Data and Algorithms (CAIBDA)

DOI: 10.1109/caibda65784.2025.11183408

Authors: Yong Lu, Jie Wu, Jie Su

Institution: Minzu University of China

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4415004152

FWCI:

Cites: 8

Cited by:

Related to: