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A Method for ADC Dynamic Parameter Testing Under Non-coherent Sampling

Year: 2025

Type: conference-paper

Source: International Joint Conference on Information and Communication Engineering (JCICE)

DOI: 10.1109/jcice66205.2025.11182081

Authors: Hongchao Zeng, Yingxiang Li

Institution: Chengdu University of Information Technology

Language: English

Topic: Advanced Electrical Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Chengdu University of Information Technology

OpenAlex ID: W4415004525

FWCI: 2.358

Cites: 11

Cited by: 1

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