Work

Application of machine learning regression algorithms to optimization of CMM measurement strategies

Year: 2025

Type: article

Source: Measurement Science and Technology

DOI: 10.1088/1361-6501/ae1155

Authors: Jakub Rzeczkowski, Sylwester Samborski, Aleksander Czajka, Mariusz Kłonica, Mateusz Janik, Konrad Krzempek, Piotr Sobecki, Marek Besztak

Institutions: Lublin University of Technology, Central Office of Measures

Language: English

Topic: Advanced Measurement and Metrology Techniques

Subfield: Mechanical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4415004739

FWCI: 0.603

Cites: 25

Cited by: 2

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