Work

Highly sensitive ultraviolet power meter based on two-dimensional van der Waals heterostructure

Year: 2025

Type: article

Source: Nanotechnology

DOI: 10.1088/1361-6528/ae1141

Authors: Bangchi Huang, Xiang Li, Jianlin Shi, Zhipeng Zhong, Yezhao Zhuang, Yizihan Zhang, Tie Lin, Xiangjian Meng, Hai Huang, Junhao Chu, Jiao Peng

Institutions: Fudan University, Chinese Academy of Sciences, Shanghai Institute of Technical Physics, State Key Laboratory of Infrared Physics, West Anhui University

Language: English

Topic: 2D Materials and Applications

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, National Key Research and Development Program of China

Awards: G2486448723, G6312845876

OpenAlex ID: W4415004848

FWCI:

Cites: 50

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