Understanding Snap-Off Phenomenon during Reverse Recovery in SiC MOSFET Body Diodes
Year: 2025
Type: conference-paper
Authors: Abhishek Maitra, Madhu Lakshman Mysore, Christian Bäumler, Josef Lutz, Thomas Basler
Institution: Chemnitz University of Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4415034776