Chip-level pre-calibration-based calibration-free metrology technology: research on high-precision current integration and voltage circuit design consistency
Year: 2025
Type: conference-paper
Source: IET conference proceedings.
Authors: Xinzheng Lin, Nick Nianxiong Tan, Haining Wang, Xiaolu Liu
Institution: Zhejiang University
Language: English
Subfield: Biomedical Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4415102480
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