Work

Outlier detection and classification in inhomogeneous voltage curves using functional depth

Year: 2025

Type: conference-paper

Source: International Conference on Machine Learning Technologies (ICMLT)

DOI: 10.1109/icmlt65785.2025.11193259

Authors: Müslüm Atas, Fatima Jammoul, Jürgen Klarner, David Raese, Thomas Reisl, Joachim Schauer, Thomas Strametz, Wilhelm Zugaj

Institutions: FH JOANNEUM University of Applied Sciences, Voestalpine (Austria)

Language: English

Topic: Advanced Statistical Methods and Models

Subfield: Statistics and Probability

Field: Mathematics

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4415125185

FWCI: 4.565

Cites: 39

Cited by: 1

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