Fault Tracing of Transformer Substation Devices via Event Graph Kernel
Year: 2025
Type: article
DOI: 10.1002/tee.70157
Authors: Weizhuo Yao, Changjiang Ju, Genke Yang, Jian Chu
Institution: Shanghai Jiao Tong University
Language: English
Subfield: Artificial Intelligence
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4415140267