Dual Locking of Cu + /Cu 0 Interface and Vacancy Defects via Al‐Doping for Efficient Electroreduction of CO 2 to C 2+ Products
Year: 2025
Type: article
Source: Small Methods
Authors: Wenqing Zhang, Chunhao Jiang, Shulin Zhao, Qianqian Zhao, Yuzhou Wang, Tao Guo, Xiaojing Liu, Yuping Wu, Yuhui Chen
Language: English
Field: Energy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4415147394
