Use-case-based evaluation and holistic testing of IEEE 2030.5 and IEC 61850 for grid integration of DER
Year: 2025
Type: conference-paper
Source: IET conference proceedings.
Authors: Zhiyu Lu, Christoph Kondzialka, Shuo Chen, Zhongran Zhang, Gerd Heilscher
Institution: Technische Hochschule Ulm
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4415168574
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