Identification of tree-related high-impedance faults using BiLSTM model
Year: 2025
Type: conference-paper
Source: IET conference proceedings.
Authors: Chunlan Yang, Junjian Wu, Yiwei Chen, Tao Wang, Xianyong Xiao, Wenhai Zhang
Institutions: Sichuan University, State Grid Corporation of China (China)
Language: English
Subfield: Control and Systems Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4415168751
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