Validation of dynamic line rating model using IEEE738 with digital twin for a power grid
Year: 2025
Type: conference-paper
Source: IET conference proceedings.
Authors: Aldrich Zeno, Basanta R. Pokhrel, Santiago S. Acevedo, Irina Oleinikova
Language: English
Subfield: Control and Systems Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4415168760
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