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A study on optimizing class A power quality measurements for low-end devices using Mixed Radix FFT combined with resampling

Year: 2025
Type: conference-paper
Authors: Je-Ho Yoo, Jae-Jun Yun, Pan-Ryeol Kim, Sang-Tack Shin, Ki-Hwan Oh, Jin-Young Park
Language: English
Open Access status: closed
OpenAlex ID: W4415169109
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