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Optimized Algorithm for Aircraft Surface Defect Detection Technology Based on YOLOV8n

Year: 2025

Type: conference-paper

Source: International Conference on Computer Vision, Application, and Algorithm (CVAA)

DOI: 10.1109/cvaa66438.2025.11193406

Authors: Chun Qi, Juan Zhang, Pengtao Lv

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4415180554

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